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X-ray Ptychography at the Edge: Towards Real-Time Feedback for High-Speed Nanoimaging

Workshop: XLOOP 2025: The 7th Annual Workshop on Extreme-Scale Experiment-in-the-Loop Computing

Authors: Zirui Gao, Seher Karakuzu, Dmitri Gavrilov, and Daniel Allan (Brookhaven National Laboratory); Adam Thompson and Denis Leshchev (NVIDIA Corporation); and Hanfei Yan (Brookhaven National Laboratory)

Abstract: X-ray ptychography is becoming an indispensable tool for nanoscale imaging, driving innovation in functional materials, electronics, life sciences, etc. To retrieve sample images, the technique relies on advanced mathematical algorithms, making it computationally intensive. Recent advances in data acquisition have greatly increased the data generation rate, making it challenging to perform reconstruction in a timely manner to support decision making during an experiment. Here, we demonstrate how efficient GPU-based iterative reconstruction algorithms, deployed at the edge, enable real-time feedback during high-speed continuous data acquisition, allowing for a more informed experiment execution and thus increasing the quality and efficiency of the measurements. These developments represent a steppingstone towards augmentation of computationally intensive experiments with data-driven decision making, paving the way for autonomous experiments performed at machine speeds.

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